儀器簡(jiǎn)介：

標(biāo)準(zhǔn)光源測(cè)試臺(tái)（D65光源，照度>1000 Lux）
照度計(jì)（量程>1000 Lux）
帶光源放大鏡
數(shù)碼相機(jī)
游標(biāo)卡尺
卷尺…
技術(shù)參數(shù)：

執(zhí)行標(biāo)準(zhǔn):
IEC 61215-2005晶體硅組件
IEC 61646-2008薄膜組件
主要特點(diǎn)：
執(zhí)行標(biāo)準(zhǔn):
IEC 61215-2005 No.10.1晶體硅組件
IEC 61646-2008 No.10.1薄膜組件
標(biāo)準(zhǔn)光源測(cè)試臺(tái)（D65光源，照度>1000 Lux）
照度計(jì)（量程>1000 Lux）
帶光源放大鏡
數(shù)碼相機(jī)
游標(biāo)卡尺
卷尺…

BR-PV-VIT Visual inspection series instruments
Implementation of standards:
IEC 61215:2005 & Ed.3, IEC 61646:2008, IEC 61730-2:2004 & Ed.2, VDE 0126-5:2008
Visual inspection table:

Table Size: ≥2.2m×1.2m
Table material: Green mat

Frame material: Aluminum alloy profile
With drawers, for storing tools
Attachment:
①Illumination meter:
Automatic range switching,
Measurement range: 0~20~200~2000~20000Lux
②Flashlight: illumination>2000Lux
③Magnifying glass

EL Solar cell testing equipment:
Implementation of standards:
- “General specification of crystalline silicon solar cell for terrestrial application”
Latent cracks 首ld not affect cells used, the crack can not more than 1mm.
With a resolution better than 0.5mm / pixel IR camera image acquisition.

Detection principle:
EL is the use of electric field excitation film silicon solar cells and solar silicon chip issued to a specific wavelength of light, and then through the filter and the special sensor specific wavelength light signal acquisition, the final film solar cells obtained after data processing defects Information. Film can be used to detect the battery cracked, debris, material defects, defects such as broken, and the reverse gate leakage test. EL defect detection test can be used for solar cells, solar cell process quality control, strengthening the incoming cells are detected. Can be applied to solar cells into, factory inspection, quality control of incoming solar cells, effectively control the level of production technology.
Compatible with the reverse leakage test, Software to switch between positive and negative test power and high precision.

Effective area: 2000mm×1350mm
Detection time: 1ms~20000ms Continuous set, Suggestion 4 seconds / piece
High sensitivity: Detection accuracy <0.2μm
Reverse leakage current: maximum 9.5A and 0~80V
Current and voltage accuracy of up to 1mV, 1mA
Automatic recognition defect Type: cracked, debris, broken gate, material defects, the resistance rates were not uniform, chipping, etc.
Software features: enlarged two-dimensional display, positive and negative test conversion, automatic power; (other functions are being constantly upgraded)